BestScope BS-4050 Trinocular Semiconductor FPD Industrial Inspection Metallurgical Microscope

BestScope BS-4050 Trinocular Semiconductor FPD Industrial Inspection Metallurgical Microscope

US$11,940.00 1 Piece (MOQ)

Basic Info.

Model NO.
BS-4050
Type
Industrial Inspection Microscope
Number of Cylinder
≥Three
Mobility
Desktop
Stereoscopic Effect
Without Stereoscopic Effect
Kind of Light Source
Ordinary Light
Shape
Cylindrical Shaped Lens
Usage
Teaching, Research
Principle
Optics
Principle of Optics
Infinity Color Corrected Optical System
Eyepiece
High eye point wide field plan eyepiece PL10X/25mm
Nosepiece
Sextuple BD nosepiece
Stage
8 inches three-layer mechanical stage
Objective
5x, 10x, 20x, 50x
Reflected Illumination
12V/100W Halogen light
Focusing
Low-position coaxial coarse and fine focusing
Transport Package
Strong Carton with Polyfoam Protection
Trademark
BestScope
Origin
Beijing
Production Capacity
50000 PCS Per Year

Product Description

IntroductionEquipped with varisized wafer holders (including 6/8 inches), BS-4050 is professionally applied for wafer and flat panel display detection. More comfortable, flexible and quicker operation is available with upgraded ergonomics design.
Features
1. Multi optional splitting ratioWith broad beam image system, maximum field of view of BS-4050 reaches to 26.5mm. Trinocular head with two optional splitting ratios of 100:0 or 0:100, 100% image outputs from eyepieces or camera. Trinocular head with three optional splitting ratios of 100:0 or 20:80 or 0:100, double-way image output of 20% from eyepieces and 80% from camera is achievable. The erect gemel trinocular head, same direction and same moving direction for objective and image, easy to view and operate.2. Stable frame
All metal frame with the characteristics of low center, high rigidity and stability for professional industrial inspection, ensures to present a stable and clear image.
3. High-performance nosepiece
High-performance nosepiece with precision bearing, is available for light and handy operation, precision resetting, controllable concentricity.
4. Large travel mechanical stage6 inches stage for option, size: 445mm*240mm, moving range: 158mm×158mm.8 inches three-layer mechanical stage, size: 525mm*330mm, moving range: 210mm*210mm, is professionally applied for industrial inspection of wafer, FPD, circuit package, PCB, materials, casting metal ceramic part, abrasive tools and so on.
Specification
ItemSpecificationBS-4050
Optical SystemInfinity Color Corrected Optical System*
Viewing Head30° inclined infinity trinocular head, erect image, interpupillary distance: 50-76mm, splitting ratio:100:0 or 0:100*
30° inclined infinity trinocular head, inverted image, interpupillary distance: 50-76mm, splitting ratio:100:0, 20:80 or 0:100
5-35° adjustable, inverted image, tilting trinocular head, interpupillary distance: 50-76mm, splitting ratio:50:50, 100:0 or 0:100
EyepieceHigh eye point wide field plan eyepiece PL10X/25mm, with adjustable diopter*
High eye point wide field plan eyepiece PL10X/25mm, with reticle and adjustable diopter
ObjectivesBD Semi-Apochromatic Metallurgical Objectives5X/NA=0.15, WD=13.5mm*
10X/NA=0.3, WD=9mm*
20X/NA=0.5, WD=2.5mm
50X/NA=0.8, WD=1mm
100X/NA=0.9, WD=1mm
Ultra-Long Working Distance BD Semi-Apochromatic Metallurgical Objectives20X/NA=0.4, WD=8.5mm*
Infinity Long Working Distance BD Semi-Apochromatic Metallurgical Objectives50X/NA=0.55, WD=7.5mm*
100X/NA=0.8, WD=2.1mm
100X/NA=0.8, WD=3.5mm
Bright Field Semi-Apochromatic Metallurgical Objectives5X/NA=0.15, WD=19.5mm
10X/NA=0.3, WD=10.9mm
20X/NA=0.5, WD=3.2mm
50X/NA=0.8, WD=1.2mm
100X/NA=0.9, WD=1mm
NosepieceSextuple BD nosepiece, with DIC slot*
Quintuple BD nosepiece, with DIC slot
Sextuple bright field nosepiece, with DIC slot
Septuple bright field nosepiece, with DIC slot
FrameReflected frame with low position coaxial focusing mechanism, coarse range: 33mm, fine precision: 0.001mm, with upper limit and tension adjustment. Built-in 100-240V wide voltage system, with brightness setting button and reset button.*
Stage8 inches three-layer mechanical stage with low position coaxial adjustment, size: 525mm*330mm, moving range: 210mm*210mm, with clutch handle for quick movement. Glass plate for reflected use.*
6 inches three-layer mechanical stage with low position coaxial adjustment, size: 445mm*240mm, moving range for reflected: 158mm*158mm, moving range for transmitted: 100*100mm, with clutch handle for quick movement. Glass plate for transmitted and reflected use.
IlluminationBright field/ dark field reflected illuminator, with variable aperture and field diaphragm, center adjustable; with switch device for bright field and dark field; with filter slot and polarizing slot.*
Halogen light box, 12V/100W, with center set, for transmitted and reflected use*
Halogen light, 12V/100W*
Polarizer and AnalyzerPolarizer and fixed analyzer
Polarizer and 360 degree rotatable analyzer*
Rotating WorkbenchRotating workbench. 8-inch wafer plate, for 6, 8 inches wafer
Interference FilterBlue interference filter for reflected use: <=480nm
Green interference filter for reflected use: 520nm-570nm
Red interference filter for reflected use: 630nm-750nm
Interference filter for reflected use, color balance plate (white light), suitable for halogen lamps*
DICDIC kit
Adapter0.35X C-mount adapter, focus adjustable
0.5X C-mount adapter, focus adjustable
0.65X C-mount adapter, focus adjustable
1X C-mount adapter
Other Accessories
Other
High precision micrometer
Internal hexagonal Spanner M4 *
Internal hexagonal Spanner M5*
Note: · Standard Outfit, ○ Optional
Accessories1. Internationally advanced eyepiece with large field of view
10X/25mm eyepiece is plan and clear even at the edge of FOV, helpful to present more complete image of the sample.
2. Long working distance objectives
A whole set of professional semi-APO metallurgical objectives, adopt the lenses with high transmission and advanced coating technology.
Long working distance objectives for option, is efficient to prevent sample damage.
3. Nomarski differential interference contrast system
Using high-performance DIC attachment, the impalpable height difference under bright field can be transformed to high contrast light difference as 3D relief. It is widely applied for detection of LCD conducting particle and surface scratch of precision disk.
4. C-mount adapter5. Interference filters6. Polarizer and analyzer7. Other Accessories
System Diagram
Dimension

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